Optical surface profilers

Optical surface profilers from Zygo are white light interferometer systems, offering fast, non-contact, high-precision 3D metrology of surface features. All of our optical surface profilers include proprietary data analysis and system control software. Choosing the right surface measurement system depends on your application's requirements, including precision, speed, automation, configuration flexibility, and vertical range.

The NewView 9000 3D optical surface profiler provides powerful versatility in non-contact optical surface profiling. With the system, it is easy and fast to measure a wide range of surface types, including smooth, rough, flat, sloped, and stepped. All measurements are nondestructive, fast, and require no sample preparation.

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Designed for the most demanding applications, the Nexview NX2 3D optical profiler combines exceptional precision, advanced algorithms, application flexibility, and automation into a single package that represents ZYGO's most advanced Coherence Scanning Interferometry (CSI) profiler.

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Zygo ZeGage vibration-resistant white light interferometer, for machined surface metrology and process control on the production floor. ISO 25178-compliant texture results ensure correlation to stylus metrology.

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The NewView 7000 white light interferometer (profilometer) is a powerful tool for characterizing and quantifying surface roughness, step heights, critical dimensions, and other topographical features with excellent precision and accuracy. All measurements are nondestructive, fast, and require no sample preparation. Profile heights ranging from < 1 nm up to 20000 µm at high speeds, independent of surface texture, magnification, or feature height! Scanning white light interfermoeter, 150 mm XY stage, man. filter tray and aperture stop.

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The ZeGage Pro and ZeGage Pro HR 3D optical profilers provide non-contact measurement and characterization of micro and nano-scale features of virtually any surface, and set the new standard for performance, ease of use, flexibility, and precision of benchtop-class industrial non-contact surface profilers.

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